APPLICATIONS OF TECHNOLOGY:

  • Thermal conductivity measurement tools
  • Evaluation of thermal performance of electronics, thermal barrier coatings, batteries
  • Electronic packaging

BENEFITS:

  • Able to measure a wide range of thermal conductivities
  • Accurate and applicable to a wide range of substrates

BACKGROUND:

The 3ω technique is a well-established method used to measure thermal conductivity of materials and thermal resistance of interfaces. This technique has the ability to provide spatially resolved thermal properties over a wide range of thermal conductivity, but so far has been limited to lab-scale use due to the difficulty in fabrication, and has limits on the substrates it can measure.

TECHNOLOGY OVERVIEW: 

Researchers at Berkeley Lab have developed a method of applying reusable 3ω sensors fabricated on flexible polyimide films to measure bulk and spatially resolved thermal properties. With this method, sample thermal conductivities up to 200 W/mK can be measured with high accuracy. Rather than fabricating the sensor on the sample, a sensor that is attached to the sample with a thermal paste is fabricated. Therefore, this technique is widely applicable to both metallic and non-metallic substrates, providing a method for high throughput 3ω measurements with reusable sensors and without considerable sample preparation.

DEVELOPMENT STAGE: 

Full-scale, similar (prototypical) system demonstrated in relevant environment

PRINCIPAL INVESTIGATORS:

Divya Chalise

IP Status: Patent pending

Additional information: Rev. Sci. Instrum. 94, 094901 (2023). https://doi.org/10.1063/5.0151160

OPPORTUNITIES: Available for licensing or collaborative research