Applications of Technology:
- Sample preparation for semiconductor, pharmaceutical, energy, and materials science industries
- Autonomous characterization integration
Benefits:
- Solvent-free particle transfer
- Increased customization of particle size selection
- Increased consistency and efficiency for experiments
Background: Traditional sample preparation methods for electron microscopy often involve manual processes and the use of solvents, which can be time-consuming and impede standardization across specimens. There is a need for automated, solvent-free sample preparation techniques to improve the efficiency and consistency in electron microscopy analysis.
Technology Overview: Scientists at Berkeley Lab have developed an automated technique for particle transfer to SEM stubs and TEM support grids without the use of solvents. The method uses high voltage to create an electric field, which attracts particles from a container and attaches them to the characterization sample holder. This approach allows for potential particle size selection by adjusting the electric field characteristics, such as current, voltage, frequency, and strength. This technology may be integrated with autonomous characterization laboratories, enhancing the automation and efficiency of sample preparation and analysis processes.
Development Stage: Laboratory scale, similar system validation in relevant environment (TRL 5).
Principal Investigators: David Milsted, Tara Mishra, Gerbrand Ceder
IP Status: Patent pending.
Opportunities: Available for collaborative research.