APPLICATIONS OF TECHNOLOGY:
- High-order harmonic generation light sources
- Diagnostics on third- and fourth-generation light sources
- Accurate, rapid spectrometry and beam profiling
- Inexpensive to build
- Minimal space requirements
- Can be implemented in new or existing systems
- Enables faster, less expensive light source building, commissioning, and use
Scientists at Berkeley Lab have invented an inexpensive device that allows for more accurate characterization of vacuum ultraviolet (VUV) and soft x-ray light sources. The compact device can be moved into position quickly and easily without affecting beam alignment. The Berkeley Lab device places the necessary instruments into a compact space (approximately 20 cm x 20 cm x 10 cm) in the vacuum adjacent to the beam where the instruments can be moved in and out of the beamline in a controlled manner. This enables switching between the modes in minutes rather than hours.
Berkeley Lab scientists built a prototype of this device onto an existing light source. The device has produced consistent characterizations for two years in day-to-day, maintenance-free operation. It is versatile and can be used on light sources covering a wide range of VUV and soft X-ray photon energies and vacuum conditions (10-6 to 10-9 mbar).
When building, commissioning, and performing experiments with VUV and soft x-ray light sources, the beam must be characterized frequently by spectrometry and beam profiling. Existing technology makes characterization time-consuming and potentially disruptive to the beam because the necessary measurements must be made with independent, costly devices or with components that have to be altered one-by-one to switch between the modes used for experimentation, spectrometry, and beam profiling. The Berkeley Lab invention provides a much more nimble alternative.
- Available for licensing or collaborative research.
- Published patent application WO 2009/094584 available at www.wipo.int.
- Functional prototype in operation.
FOR MORE INFORMATION:
Kornilov, O., Wilcox, R., Gessner, O., “Nanograting-based compact vacuum ultraviolet specrometer and beam profiler for in situ characterization of high-order harmonic generation light sources,” Review of Scientific Instruments 2010, 81, 063109.
To learn more about licensing a technology from LBNL see http://www.lbl.gov/Tech-Transfer/licensing/index.html.
REFERENCE NUMBER: IB-2520
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